{"id":1845,"date":"2021-05-04T15:28:38","date_gmt":"2021-05-04T12:28:38","guid":{"rendered":"https:\/\/sites.uef.fi\/photonics\/?page_id=1845"},"modified":"2021-05-24T13:40:15","modified_gmt":"2021-05-24T10:40:15","slug":"profilometry","status":"publish","type":"page","link":"https:\/\/sites.uef.fi\/photonics\/profilometry\/","title":{"rendered":"Profilometry"},"content":{"rendered":"<p><strong>Profilometry<\/strong><\/p>\n<p><strong>Profilometric measurements and analysis<\/strong><\/p>\n<p>We offer surface shape and quality measurements for optical and mechanical applications.<\/p>\n<p>We use white light interferometry on optical microscope and stylus profilometry for surface measurements.<\/p>\n<p>Application areas include optical or mechanic component surface quality evaluation at nanometer scale resolution. Methods are suitable for slightly curved, centimeter sized transparent or opaque solid objects.<\/p>\n<p>Our equipment includes:<\/p>\n<ul>\n<li>WYKO NT9300 optical profilometer with Phase Shift Interferometry and Vertical Scan Interferometry. Measurement range and accuracy depend on the object to be measured and measurement mode selected.<\/li>\n<li>Dektak 150 stylus profilometer up to 1 mm surface range and 0.13 % measurement accuracy.<\/li>\n<\/ul>\n<p>A state-of-the-art coordinate measurement\/surface profilometry instrument to be installed on year 2022.<\/p>\n<p>In our services, we follow the official price lists of the University of Eastern Finland which are checked annually.<\/p>\n<p>Contact person:<\/p>\n<p>Yli-insin\u00f6\u00f6ri Pertti P\u00e4\u00e4kk\u00f6nen<br \/>\npertti.paakkonen@uef.fi<br \/>\n0505056376<br \/>\nIt\u00e4-Suomen yliopisto, Yliopistokatu 7, 80100 Joensuu<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Profilometry Profilometric measurements and analysis We offer surface shape and quality measurements for optical and mechanical applications. We use white light interferometry on optical microscope and stylus profilometry for surface measurements. Application areas include optical or mechanic component surface quality evaluation at nanometer scale resolution. Methods are suitable for slightly curved, centimeter sized transparent or [&hellip;]<\/p>\n","protected":false},"author":243,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_acf_changed":false,"_monsterinsights_skip_tracking":false,"_monsterinsights_sitenote_active":false,"_monsterinsights_sitenote_note":"","_monsterinsights_sitenote_category":0,"footnotes":""},"class_list":["post-1845","page","type-page","status-publish","hentry"],"acf":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.1.1 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>Profilometry - Center for Photonics Sciences<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/sites.uef.fi\/photonics\/profilometry\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Profilometry - Center for Photonics Sciences\" \/>\n<meta property=\"og:description\" content=\"Profilometry Profilometric measurements and analysis We offer surface shape and quality measurements for optical and mechanical applications. 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