{"id":1851,"date":"2021-05-04T15:28:46","date_gmt":"2021-05-04T12:28:46","guid":{"rendered":"https:\/\/sites.uef.fi\/photonics\/?page_id=1851"},"modified":"2021-05-24T13:51:53","modified_gmt":"2021-05-24T10:51:53","slug":"microscopy","status":"publish","type":"page","link":"https:\/\/sites.uef.fi\/photonics\/microscopy\/","title":{"rendered":"Microscopy"},"content":{"rendered":"<p><strong>Microscopy<\/strong><\/p>\n<p><strong>Microscopy measurements and analysis<\/strong><\/p>\n<p>We offer a variety of microscopy measurement services for optical and mechanic applications.<\/p>\n<p>Application areas include high resolution surface analysis. Methods are suitable for centimeter sized solid objects.<\/p>\n<p>Our equipment includes:<\/p>\n<ul>\n<li>LEO 1550 Scanning Electron Microscope (SEM)<\/li>\n<li>Leica LM DM optical microscope<\/li>\n<li>Olympus optical microscopes<\/li>\n<\/ul>\n<p>In our services, we follow the official price lists of the University of Eastern Finland which are checked annually.<\/p>\n<p>Contact person:<\/p>\n<p>Yli-insin\u00f6\u00f6ri Pertti P\u00e4\u00e4kk\u00f6nen<br \/>\npertti.paakkonen@uef.fi<br \/>\n0505056376<br \/>\nIt\u00e4-Suomen yliopisto, Yliopistokatu 7, 80100 Joensuu<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Microscopy Microscopy measurements and analysis We offer a variety of microscopy measurement services for optical and mechanic applications. Application areas include high resolution surface analysis. Methods are suitable for centimeter sized solid objects. Our equipment includes: LEO 1550 Scanning Electron Microscope (SEM) Leica LM DM optical microscope Olympus optical microscopes In our services, we follow [&hellip;]<\/p>\n","protected":false},"author":243,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_acf_changed":false,"_monsterinsights_skip_tracking":false,"_monsterinsights_sitenote_active":false,"_monsterinsights_sitenote_note":"","_monsterinsights_sitenote_category":0,"footnotes":""},"class_list":["post-1851","page","type-page","status-publish","hentry"],"acf":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.1.1 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>Microscopy - Center for Photonics Sciences<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/sites.uef.fi\/photonics\/microscopy\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Microscopy - Center for Photonics Sciences\" \/>\n<meta property=\"og:description\" content=\"Microscopy Microscopy measurements and analysis We offer a variety of microscopy measurement services for optical and mechanic applications. Application areas include high resolution surface analysis. Methods are suitable for centimeter sized solid objects. 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