{"id":1863,"date":"2021-05-04T15:29:41","date_gmt":"2021-05-04T12:29:41","guid":{"rendered":"https:\/\/sites.uef.fi\/photonics\/?page_id=1863"},"modified":"2021-05-24T13:48:25","modified_gmt":"2021-05-24T10:48:25","slug":"ellipsometry","status":"publish","type":"page","link":"https:\/\/sites.uef.fi\/photonics\/ellipsometry\/","title":{"rendered":"Ellipsometry"},"content":{"rendered":"<p><strong>Ellipsometry<\/strong><\/p>\n<p><strong>Ellipsometric material analysis<\/strong><\/p>\n<p>We offer ellipsometry measurements for optical properties measurements of thin films.<\/p>\n<p>We use visible and near infrared spectral ellipsometer for measuring material optical properties and thin film thicknesses.<\/p>\n<p>Application areas include analysis of optical and thin metallic coatings. Thin means, in general, less than 5 micrometers.<\/p>\n<p>Our equipment includes:<\/p>\n<ul>\n<li>A. Woollam VASE spectral ellipsometer capable for 260 \u2013 2060 nm wavelength range.<\/li>\n<\/ul>\n<p>In our services, we follow the official price lists of the University of Eastern Finland which are checked annually.<\/p>\n<p>Contact person:<\/p>\n<p>Yli-insin\u00f6\u00f6ri Pertti P\u00e4\u00e4kk\u00f6nen<br \/>\npertti.paakkonen@uef.fi<br \/>\n0505056376<br \/>\nIt\u00e4-Suomen yliopisto, Yliopistokatu 7, 80100 Joensuu<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Ellipsometry Ellipsometric material analysis We offer ellipsometry measurements for optical properties measurements of thin films. We use visible and near infrared spectral ellipsometer for measuring material optical properties and thin film thicknesses. Application areas include analysis of optical and thin metallic coatings. Thin means, in general, less than 5 micrometers. Our equipment includes: A. Woollam [&hellip;]<\/p>\n","protected":false},"author":243,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_acf_changed":false,"_monsterinsights_skip_tracking":false,"_monsterinsights_sitenote_active":false,"_monsterinsights_sitenote_note":"","_monsterinsights_sitenote_category":0,"footnotes":""},"class_list":["post-1863","page","type-page","status-publish","hentry"],"acf":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.1.1 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>Ellipsometry - Center for Photonics Sciences<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/sites.uef.fi\/photonics\/ellipsometry\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Ellipsometry - Center for Photonics Sciences\" \/>\n<meta property=\"og:description\" content=\"Ellipsometry Ellipsometric material analysis We offer ellipsometry measurements for optical properties measurements of thin films. We use visible and near infrared spectral ellipsometer for measuring material optical properties and thin film thicknesses. Application areas include analysis of optical and thin metallic coatings. Thin means, in general, less than 5 micrometers. Our equipment includes: A. Woollam [&hellip;]\" \/>\n<meta property=\"og:url\" content=\"https:\/\/sites.uef.fi\/photonics\/ellipsometry\/\" \/>\n<meta property=\"og:site_name\" content=\"Center for Photonics Sciences\" \/>\n<meta property=\"article:modified_time\" content=\"2021-05-24T10:48:25+00:00\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\/\/schema.org\",\"@graph\":[{\"@type\":\"WebPage\",\"@id\":\"https:\/\/sites.uef.fi\/photonics\/ellipsometry\/\",\"url\":\"https:\/\/sites.uef.fi\/photonics\/ellipsometry\/\",\"name\":\"Ellipsometry - Center for Photonics Sciences\",\"isPartOf\":{\"@id\":\"https:\/\/sites.uef.fi\/photonics\/#website\"},\"datePublished\":\"2021-05-04T12:29:41+00:00\",\"dateModified\":\"2021-05-24T10:48:25+00:00\",\"breadcrumb\":{\"@id\":\"https:\/\/sites.uef.fi\/photonics\/ellipsometry\/#breadcrumb\"},\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\/\/sites.uef.fi\/photonics\/ellipsometry\/\"]}]},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\/\/sites.uef.fi\/photonics\/ellipsometry\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\/\/sites.uef.fi\/photonics\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"Ellipsometry\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\/\/sites.uef.fi\/photonics\/#website\",\"url\":\"https:\/\/sites.uef.fi\/photonics\/\",\"name\":\"Center for Photonics Sciences\",\"description\":\"\",\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\/\/sites.uef.fi\/photonics\/?s={search_term_string}\"},\"query-input\":{\"@type\":\"PropertyValueSpecification\",\"valueRequired\":true,\"valueName\":\"search_term_string\"}}],\"inLanguage\":\"en-US\"}]}<\/script>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"title":"Ellipsometry - Center for Photonics Sciences","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/sites.uef.fi\/photonics\/ellipsometry\/","og_locale":"en_US","og_type":"article","og_title":"Ellipsometry - Center for Photonics Sciences","og_description":"Ellipsometry Ellipsometric material analysis We offer ellipsometry measurements for optical properties measurements of thin films. We use visible and near infrared spectral ellipsometer for measuring material optical properties and thin film thicknesses. Application areas include analysis of optical and thin metallic coatings. Thin means, in general, less than 5 micrometers. Our equipment includes: A. Woollam [&hellip;]","og_url":"https:\/\/sites.uef.fi\/photonics\/ellipsometry\/","og_site_name":"Center for Photonics Sciences","article_modified_time":"2021-05-24T10:48:25+00:00","twitter_card":"summary_large_image","schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"WebPage","@id":"https:\/\/sites.uef.fi\/photonics\/ellipsometry\/","url":"https:\/\/sites.uef.fi\/photonics\/ellipsometry\/","name":"Ellipsometry - Center for Photonics Sciences","isPartOf":{"@id":"https:\/\/sites.uef.fi\/photonics\/#website"},"datePublished":"2021-05-04T12:29:41+00:00","dateModified":"2021-05-24T10:48:25+00:00","breadcrumb":{"@id":"https:\/\/sites.uef.fi\/photonics\/ellipsometry\/#breadcrumb"},"inLanguage":"en-US","potentialAction":[{"@type":"ReadAction","target":["https:\/\/sites.uef.fi\/photonics\/ellipsometry\/"]}]},{"@type":"BreadcrumbList","@id":"https:\/\/sites.uef.fi\/photonics\/ellipsometry\/#breadcrumb","itemListElement":[{"@type":"ListItem","position":1,"name":"Home","item":"https:\/\/sites.uef.fi\/photonics\/"},{"@type":"ListItem","position":2,"name":"Ellipsometry"}]},{"@type":"WebSite","@id":"https:\/\/sites.uef.fi\/photonics\/#website","url":"https:\/\/sites.uef.fi\/photonics\/","name":"Center for Photonics Sciences","description":"","potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"https:\/\/sites.uef.fi\/photonics\/?s={search_term_string}"},"query-input":{"@type":"PropertyValueSpecification","valueRequired":true,"valueName":"search_term_string"}}],"inLanguage":"en-US"}]}},"_links":{"self":[{"href":"https:\/\/sites.uef.fi\/photonics\/wp-json\/wp\/v2\/pages\/1863","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/sites.uef.fi\/photonics\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/sites.uef.fi\/photonics\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/sites.uef.fi\/photonics\/wp-json\/wp\/v2\/users\/243"}],"replies":[{"embeddable":true,"href":"https:\/\/sites.uef.fi\/photonics\/wp-json\/wp\/v2\/comments?post=1863"}],"version-history":[{"count":2,"href":"https:\/\/sites.uef.fi\/photonics\/wp-json\/wp\/v2\/pages\/1863\/revisions"}],"predecessor-version":[{"id":2314,"href":"https:\/\/sites.uef.fi\/photonics\/wp-json\/wp\/v2\/pages\/1863\/revisions\/2314"}],"wp:attachment":[{"href":"https:\/\/sites.uef.fi\/photonics\/wp-json\/wp\/v2\/media?parent=1863"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}