{"id":2290,"date":"2021-05-24T13:44:45","date_gmt":"2021-05-24T10:44:45","guid":{"rendered":"https:\/\/sites.uef.fi\/photonics\/?page_id=2290"},"modified":"2021-05-24T13:44:45","modified_gmt":"2021-05-24T10:44:45","slug":"profilometry","status":"publish","type":"page","link":"https:\/\/sites.uef.fi\/photonics\/profilometry\/?lang=fi","title":{"rendered":"Profilometria"},"content":{"rendered":"<p><strong>Profilometria<\/strong><\/p>\n<p>Tarjoamme pinnan muodon sek\u00e4 pinnan laadun mittausta optisiin ja mekaanisiin sovelluksiin<\/p>\n<p>K\u00e4yt\u00e4mme valkoisen valon interferometi\u00e4 sek\u00e4 stylus-profilmetri\u00e4 pintojen mittaamiseen.<\/p>\n<p>Sovelluskohteisiin kuuluvat optisten tai mekaanisten kappaleiden pinnan muodon ja laadun m\u00e4\u00e4ritt\u00e4minen nanometritason mittaustarkkuudella. Menetelm\u00e4t sopivat liev\u00e4sti kaareville, senttimetrikokoisille pinnoille joko l\u00e4pin\u00e4kyville tai l\u00e4pin\u00e4kym\u00e4tt\u00f6mille kappaleille.<\/p>\n<p>Laitteistomme kattaa<\/p>\n<ul>\n<li>WYKO NT9300 optinen profilometri Phase Shift Interferometriall tai Vertival Scan Interferometrialla. Mittausalue ja tarkkuus riippuvat mitattavasta kappaleesta ja k\u00e4ytett\u00e4v\u00e4st\u00e4 mittausmenetelm\u00e4st\u00e4.<\/li>\n<li>Veeco Dektak 150 stylus profilometri. Suurin mittausalue 1 mm ja mittaustarkkuus 0,13 %.<\/li>\n<\/ul>\n<p>Korkealuokkainen koordinaattimittauskone\/pintaprofiilin mittauslaite k\u00e4ytett\u00e4viss\u00e4 vuonna 2022.<\/p>\n<p>Palvelumyynniss\u00e4 noudatetaan It\u00e4-Suomen yliopiston vuosittain tarkistettavaa hinnoittelua.<\/p>\n<p>Yhteyshenkil\u00f6:<\/p>\n<p>Yli-insin\u00f6\u00f6ri Pertti P\u00e4\u00e4kk\u00f6nen<br \/>\npertti.paakkonen@uef.fi<br \/>\n0505056376<br \/>\nIt\u00e4-Suomen yliopisto, Yliopistokatu 7, 80100 Joensuu<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Profilometria Tarjoamme pinnan muodon sek\u00e4 pinnan laadun mittausta optisiin ja mekaanisiin sovelluksiin K\u00e4yt\u00e4mme valkoisen valon interferometi\u00e4 sek\u00e4 stylus-profilmetri\u00e4 pintojen mittaamiseen. Sovelluskohteisiin kuuluvat optisten tai mekaanisten kappaleiden pinnan muodon ja laadun m\u00e4\u00e4ritt\u00e4minen nanometritason mittaustarkkuudella. Menetelm\u00e4t sopivat liev\u00e4sti kaareville, senttimetrikokoisille pinnoille joko l\u00e4pin\u00e4kyville tai l\u00e4pin\u00e4kym\u00e4tt\u00f6mille kappaleille. Laitteistomme kattaa WYKO NT9300 optinen profilometri Phase Shift Interferometriall tai Vertival [&hellip;]<\/p>\n","protected":false},"author":243,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_acf_changed":false,"_monsterinsights_skip_tracking":false,"_monsterinsights_sitenote_active":false,"_monsterinsights_sitenote_note":"","_monsterinsights_sitenote_category":0,"footnotes":""},"class_list":["post-2290","page","type-page","status-publish","hentry"],"acf":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.1.1 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>Profilometria - Center for Photonics Sciences<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/sites.uef.fi\/photonics\/profilometry\/?lang=fi\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Profilometria - Center for Photonics Sciences\" \/>\n<meta property=\"og:description\" content=\"Profilometria Tarjoamme pinnan muodon sek\u00e4 pinnan laadun mittausta optisiin ja mekaanisiin sovelluksiin K\u00e4yt\u00e4mme valkoisen valon interferometi\u00e4 sek\u00e4 stylus-profilmetri\u00e4 pintojen mittaamiseen. 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Sovelluskohteisiin kuuluvat optisten tai mekaanisten kappaleiden pinnan muodon ja laadun m\u00e4\u00e4ritt\u00e4minen nanometritason mittaustarkkuudella. Menetelm\u00e4t sopivat liev\u00e4sti kaareville, senttimetrikokoisille pinnoille joko l\u00e4pin\u00e4kyville tai l\u00e4pin\u00e4kym\u00e4tt\u00f6mille kappaleille. 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