X-ray photoelectron spectroscopy (XPS/ESCA)

Instrumentation

• Thermo Fisher Nexsa G2, a high-resolution XPS device with energy resolution up to < 0.5 eV FWHM
• Argon cluster gun for sputtering, with both monatomic and cluster modes available (MAGSIS)
• 2D-imaging with ultimate spatial resolution of 10 μm
• Dual charge compensation for accurate analysis of both insulating and conductive samples
• Ultra-high vacuum analysis chamber, up to 5xE-9 mbar
• UV Photoelectron Spectroscopy (UPS)
• Ion Scattering Spectroscopy (ISS)
• Reflected Electron Energy Loss Spectroscopy (REELS)
• Sample heating stage for in-situ temperature controlled measurements, range 25 – 800 °C
• Sample transfer module for air sensitive samples to be prepared in a glove box

Analysis

• All the methods are extremely surface sensitive. ISS for the most topmost atomic layer, XPS penetration depth ~10 nm.
• Quantitative elemental analysis by nondestructive methods
• Oxidation states of different elements, which can also be quantified
• 2D-mapping for visual distribution, max resolution 10 μm
• Depth profiling for all kind of materials. Cluster gun enables the profiling of polymer samples without damaging the chemical structure.
• Valence energy and Work function determination by UPS
• Band gap determination by REELS
• Elemental identification of the topmost atomic layer by ISS

Sample requirements

• Only solid samples can be measured due to the vacuum in the analysis chamber
• Maximum sample dimensions 60 mm x 60 mm x 20 mm (length x width x height)