Ellipsometry

Ellipsometry

Ellipsometric material analysis

We offer ellipsometry measurements for optical properties measurements of thin films.

We use visible and near infrared spectral ellipsometer for measuring material optical properties and thin film thicknesses.

Application areas include analysis of optical and thin metallic coatings. Thin means, in general, less than 5 micrometers.

Our equipment includes:

• A. Woollam VASE spectral ellipsometer capable for 260 – 2060 nm wavelength range.

In our services, we follow the official price lists of the University of Eastern Finland which are checked annually.

Contact person:

Yli-insinööri Pertti Pääkkönen
pertti.paakkonen@uef.fi
0505056376
Itä-Suomen yliopisto, Yliopistokatu 7, 80100 Joensuu